- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄376671 > DF2S5.6S (Toshiba Corporation) Zener Diode; Application: General; Pd (mW): 200; Vz (V): 10.76 to 11.22; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP PDF資料下載
參數(shù)資料
| 型號(hào)： | DF2S5.6S |
| 廠商： | Toshiba Corporation |
| 英文描述： | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 10.76 to 11.22; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
| 中文描述： | 產(chǎn)品使用，但對(duì)靜電放電（ESD）保護(hù)。 |
| 文件頁(yè)數(shù)： | 1/3頁(yè) |
| 文件大小： | 125K |
| 代理商： | DF2S5.6S |
DF2S5.6S
2007-11-01
1
TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type
DF2S5.6S
Product for Use Only as Protection against Electrostatic
Discharge (ESD).
*
This product is for protection against electrostatic discharge (ESD)
only and is not intended for any other usage, including without
limitation, the constant voltage diode application.
z
2terminal ultra small package suitable for mounting on small space.
Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Power dissipation
P
150
*
mW
Junction temperature
T
j
150
°
C
Storage temperature range
T
stg
55~150
°
C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate, etc).
*
: Mounted on a glass-epoxy circuit board of 20 × 20 mm, pad dimensions of 4 × 4 mm.
Electrical Characteristics
(Ta = 25°C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Zener voltage
V
Z
I
Z
= 5 mA
5.3
5.6
6.0
V
Dynamic impedance
Z
Z
I
Z
= 5 mA
―
―
30
Reverse current
I
R
V
R
= 3.5 V
―
―
1
μ
A
Total capacitance
C
T
V
R
=
0 V, f
=
1 MHz
―
40
―
pF
Guaranteed Level of ESD Immunity
Marking
Equivalent Circuit
(Top View)
6 .
Criterion: No damage to device elements
Unit: mm
C
JEDEC
JEITA
TOSHIBA
1-1K1A
Weight: 0.0001 g (typ.)
Test Condition
ESD Immunity Level
IEC61000-4-2
(contact discharge)
±30 kV
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| DF2S6.2FS | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 11.10 to 11.56; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
| DF2S6.8FS | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 11.42 to 12.60; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
| DF2S6.8S | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 11.42 to 11.90; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
| DF2S8.2FS | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 11.74 to 12.24; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
| DF2S8.2S | Zener Diode; Application: General; Pd (mW): 200; Vz (V): 12.08 to 12.60; Condition Iz at Vz (mA): 5; C (pF) max: -; Condition VR at C (V):   ESD (kV) min: -; Package: URP |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| DF2S6.2FS | 制造商:TOSHIBA 制造商全稱:Toshiba Semiconductor 功能描述:Product for Use Only as Protection against Electrostatic Discharge (ESD). |
| DF2S6.2FS(TPL3) | 制造商:Toshiba America Electronic Components 功能描述:Diode,ESD Pro,Vz=6.2V,Ir(max)=1#?A,fSC |
| DF2S6.2FSTPL3 | 制造商:Toshiba America Electronic Components 功能描述:TVS DIODE 5VWM |
| DF2S6.8CT(TPL3) | 功能描述:ESD 抑制器 ZENER DIODE RoHS:否 制造商:STMicroelectronics 通道:8 Channels 擊穿電壓:8 V 電容:45 pF 端接類型:SMD/SMT 封裝 / 箱體:uQFN-16 功率耗散 Pd: 工作溫度范圍:- 40 C to + 85 C |
| DF2S6.8FS | 制造商:TOSHIBA 制造商全稱:Toshiba Semiconductor 功能描述:Product for Use Only as Protection against Electrostatic Discharge (ESD). |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。